Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11211223 | System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy | Ivan Lazic, Stefano Vespucci, Bert Henning Freitag | 2021-12-28 |
| 10699872 | Discriminative imaging technique in scanning transmission charged particle microscopy | Ivan Lazic, Robert Imlau | 2020-06-30 |
| 10607811 | Multi-beam scanning transmission charged particle microscope | Ali Mohammadi-Gheidari, Ivan Lazic, Gerard Nicolaas Anne van Veen | 2020-03-31 |
| 10573488 | Method of performing tomographic imaging in a charged-particle microscope | Ivan Lazic | 2020-02-25 |
| 10446366 | Imaging technique in scanning transmission charged particle microscopy | Ivan Lazic | 2019-10-15 |
| 10403469 | Method of performing tomographic imaging in a charged-particle microscope | Ivan Lazic | 2019-09-03 |
| 10008363 | Method of imaging a specimen using ptychography | Bart Jozef Janssen | 2018-06-26 |
| 9959639 | Method of ptychographic imaging | Ivan Lazic | 2018-05-01 |
| 9711325 | Charged-particle microscope providing depth-resolved imagery | Faysal Boughorbel, Pavel Potocek, Xiaodong Zhuge, Berend Helmerus Lich | 2017-07-18 |
| 9312098 | Method of examining a sample in a charged-particle microscope | Ivan Lazic, Faysal Boughorbel, Bart Buijsse, Kasim Sader, Sorin Lazar | 2016-04-12 |
| 9206504 | Low energy ion milling or deposition | Johannes Jacobus Lambertus Mulders, Remco Theodorus Johannes Petrus Geurts, Petrus Hubertus Franciscus Trompenaars | 2015-12-08 |
| 9208993 | Charged-particle microscopy with enhanced electron detection | Albertus Aemillius Seyno Sluijterman | 2015-12-08 |
| 8952328 | Charged particle detector system comprising a conversion electrode | Albertus Aemillius Seyno Sluijterman, Patrick David Vogelsang, Johannes Adrianus Carolus Cooijmans | 2015-02-10 |
| 8704176 | Charged particle microscope providing depth-resolved imagery | Faysal Boughorbel, Pavel Potocek, Xiaodong Zhuge, Berend Helmerus Lich | 2014-04-22 |
| 8581189 | Charged particle microscopy imaging method | Faysal Boughorbel, Cornelis Sander Kooijman, Berend Helmerus Lich, Alan Frank de Jong | 2013-11-12 |
| 8232523 | SEM imaging method | Faysal Boughorbel, Cornelis Sander Kooijman, Berend Helmerus Lich | 2012-07-31 |
| 7518300 | Method and device for the generation of a plasma through electric discharge in a discharge space | Jeroen Jonkers, Willi Neff, Gunther Hans Derra | 2009-04-14 |