XZ

Xiaodong Zhuge

FE Fei: 2 patents #250 of 681Top 40%
📍 Tilburg, NL: #95 of 307 inventorsTop 35%
Overall (All Time): #1,986,444 of 4,157,543Top 50%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9711325 Charged-particle microscope providing depth-resolved imagery Faysal Boughorbel, Eric Gerardus Theodoor Bosch, Pavel Potocek, Berend Helmerus Lich 2017-07-18
8704176 Charged particle microscope providing depth-resolved imagery Faysal Boughorbel, Eric Gerardus Theodoor Bosch, Pavel Potocek, Berend Helmerus Lich 2014-04-22