Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11482400 | Method, device and system for remote deep learning for microscopic image reconstruction and segmentation | Remco Schoenmakers, Maurice PEEMAN, Pavel Potocek | 2022-10-25 |
| 10903043 | Method, device and system for remote deep learning for microscopic image reconstruction and segmentation | Remco Schoenmakers, Maurice Peemen, Pavel Potocek | 2021-01-26 |
| 10811223 | Method of analyzing surface modification of a specimen in a charged-particle microscope | Pavel Potocek, Mathijs Petrus Wilhelmus van den Boogaard, Emine Korkmaz | 2020-10-20 |
| 10545100 | X-ray imaging technique | Bart Buijsse | 2020-01-28 |
| 10128080 | Three-dimensional imaging in charged-particle microscopy | Pavel Potocek, Ingo Gestmann | 2018-11-13 |
| 10115561 | Method of analyzing surface modification of a specimen in a charged-particle microscope | Pavel Potocek, Mathijs Petrus Wilhelmus van den Boogaard, Emine Korkmaz | 2018-10-30 |
| 9934936 | Charged particle microscope with special aperture plate | Pavel Potocek, Franciscus Martinus Henricus Maria van Laarhoven, Remco Schoenmakers, Peter Christiaan Tiemeijer | 2018-04-03 |
| 9711325 | Charged-particle microscope providing depth-resolved imagery | Eric Gerardus Theodoor Bosch, Pavel Potocek, Xiaodong Zhuge, Berend Helmerus Lich | 2017-07-18 |
| 9620330 | Mathematical image assembly in a scanning-type microscope | Pavel Poto{hacek over (c)}ek, Cornelis Sander Kooijman, Hendrik Nicolaas Slingerland, Gerard Nicolaas Anne van Veen | 2017-04-11 |
| 9478393 | Computational scanning microscopy with improved resolution | Pavel Potocek, Berend Helmerus Lich, Matthias Langhorst | 2016-10-25 |
| 9312098 | Method of examining a sample in a charged-particle microscope | Ivan Lazic, Eric Gerardus Theodoor Bosch, Bart Buijsse, Kasim Sader, Sorin Lazar | 2016-04-12 |
| 8704176 | Charged particle microscope providing depth-resolved imagery | Eric Gerardus Theodoor Bosch, Pavel Potocek, Xiaodong Zhuge, Berend Helmerus Lich | 2014-04-22 |
| 8698078 | Charged-particle microscopy with occlusion detection | Daniel Woodrow Phifer, Jr. | 2014-04-15 |
| 8586921 | Charged-particle microscope providing depth-resolved imagery | Pavel Potocek, Cornelis Sander Kooijman, Berend Helmerus Lich | 2013-11-19 |
| 8581189 | Charged particle microscopy imaging method | Eric Gerardus Theodoor Bosch, Cornelis Sander Kooijman, Berend Helmerus Lich, Alan Frank de Jong | 2013-11-12 |
| 8340399 | Method for determining a depth map from images, device for determining a depth map | — | 2012-12-25 |
| 8232523 | SEM imaging method | Cornelis Sander Kooijman, Berend Helmerus Lich, Eric Gerardus Theodoor Bosch | 2012-07-31 |