Issued Patents All Time
Showing 1–25 of 29 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10692691 | Pulse processing | Nikolaos Kontaras, Bart Jozef Janssen, Duarte Guerreiro Tome Antunes | 2020-06-23 |
| 10403470 | Pulse processing | Nikolaos Kontaras, Bart Jozef Janssen, Duarte Guerreiro Tome Antunes | 2019-09-03 |
| 10002742 | Composite scan path in a charged particle microscope | Pavel Potocek, Hendrik Jan de Vos, Hendrik Nicolaas Slingerland | 2018-06-19 |
| 9865427 | User interface for an electron microscope | Martinus P. M. Bierhoff, Bart Buijsse, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more | 2018-01-09 |
| 9812287 | Charged particle microscope with improved spectroscopic functionality | Thijs Thomas Withaar, Gerard Nicolaas Anne van Veen | 2017-11-07 |
| 9620330 | Mathematical image assembly in a scanning-type microscope | Pavel Poto{hacek over (c)}ek, Hendrik Nicolaas Slingerland, Gerard Nicolaas Anne van Veen, Faysal Boughorbel | 2017-04-11 |
| 9502211 | Adaptive scanning for particle size using directed beam signal analysis | Jacob Simon Faber | 2016-11-22 |
| 9361275 | Method for analyzing an EDS signal | Hendrik Jan de Vos | 2016-06-07 |
| 9025018 | User interface for an electron microscope | Martinus P. M. Bierhoff, Bart Buijsse, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more | 2015-05-05 |
| 8941072 | Silicon drift diode detector configured to switch between pulse height measurement mode and current measurement mode | Gerard Anne Nicolaas van Veen | 2015-01-27 |
| 8748816 | Clustering of multi-modal data | Sander Richard Marie Stoks | 2014-06-10 |
| 8707461 | Scanning method for scanning a sample with a probe | Arthur Reinout Hartong | 2014-04-22 |
| 8624206 | Pattern modification schemes for improved FIB patterning | Tom Miller, Gene Mirro, Hendrik Jan de Vos | 2014-01-07 |
| 8586921 | Charged-particle microscope providing depth-resolved imagery | Faysal Boughorbel, Pavel Potocek, Berend Helmerus Lich | 2013-11-19 |
| 8581189 | Charged particle microscopy imaging method | Faysal Boughorbel, Eric Gerardus Theodoor Bosch, Berend Helmerus Lich, Alan Frank de Jong | 2013-11-12 |
| 8450820 | Radiation detector | Lis Karen Nanver, Thomas Ludovicus Maria Scholtes, Agata {hacek over (S)}akić, Gerard Nicolaas Anne van Veen | 2013-05-28 |
| 8354587 | Hermetically sealed housing with electrical feed-in | Hendrik Gezinus Tappel | 2013-01-15 |
| 8334512 | Detector system for use with transmission electron microscope spectroscopy | Uwe Luecken, Frank Jeroen Pieter Schuurmans | 2012-12-18 |
| 8314409 | Pattern modification schemes for improved FIB patterning | Tom Miller, Gene Mirro, Hendrik Jan de Vos | 2012-11-20 |
| 8309921 | Compact scanning electron microscope | Martinus P. M. Bierhoff, Bart Buijsse, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more | 2012-11-13 |
| 8288724 | Dark field detector for use in an electron microscope | Gerardus N. A. Van Veen, Albertus Aemillius Seyno Sluijterman | 2012-10-16 |
| 8232523 | SEM imaging method | Faysal Boughorbel, Berend Helmerus Lich, Eric Gerardus Theodoor Bosch | 2012-07-31 |
| 7906762 | Compact scanning electron microscope | MART PETRUS MARIA BIERHOFF, Bart Buijsse, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more | 2011-03-15 |
| 6852982 | Magnetic lens | Martinus P. M. Bierhoff, Colin August Sanford | 2005-02-08 |
| 5512760 | Optical height detector with coaxial irradiation and image axes and plural detectors spaced along the image axis | Joseph L. Horijon, Christiaan H. F. Velzel | 1996-04-30 |