Issued Patents All Time
Showing 25 most recent of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12396663 | Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user | Jose Hector Hernandez-Rosas, Mark Dervaes, Peter C. Simpson, Apurv Ullas Kamath, Shawn Larvenz +1 more | 2025-08-26 |
| 12310723 | Advanced continuous analyte monitoring system | Sebastian Bohm, Mark Dervaes, Eric Johnson, Apurv Ullas Kamath, Shawn Larvenz +11 more | 2025-05-27 |
| 12303262 | Advanced continuous analyte monitoring system | Sebastian Bohm, Mark Dervaes, Eric Johnson, Apurv Ullas Kamath, Shawn Larvenz +11 more | 2025-05-20 |
| 11690538 | Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user | Jose Hector Hernandez-Rosas, Mark Dervaes, Peter C. Simpson, Apurv Ullas Kamath, Shawn Larvenz +1 more | 2023-07-04 |
| 11278244 | Systems, devices and methods for analyte monitoring system | Douglas William Burnette, Hari Hampapuram, Apurv Ullas Kamath, Shawn Larvenz, Aditya Mandapaka +4 more | 2022-03-22 |
| 11179069 | Advanced continuous analyte monitoring system | Sebastian Bohm, Mark Dervaes, Eric Johnson, Apurv Ullas Kamath, Shawn Larvenz +11 more | 2021-11-23 |
| 10687740 | Advanced continuous analyte monitoring system | Sebastian Bohm, Mark Dervaes, Eric Johnson, Apurv Ullas Kamath, Shawn Larvenz +11 more | 2020-06-23 |
| 10362973 | Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user | Jose Hector Hernandez-Rosas, Mark Dervaes, Peter C. Simpson, Apurv Ullas Kamath, Shawn Larvenz +1 more | 2019-07-30 |
| 10312162 | Methods and apparatus for semiconductor sample workflow | Konstantin J. Balashov | 2019-06-04 |
| 10231653 | Advanced continuous analyte monitoring system | Sebastian Bohm, Mark Dervaes, Eric Johnson, Apurv Ullas Kamath, Shawn Larvenz +11 more | 2019-03-19 |
| 10052050 | Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user | Jose Hector Hernandez-Rosas, Mark Dervaes, Peter C. Simpson, Apurv Ullas Kamath, Shawn Larvenz +1 more | 2018-08-21 |
| 9257261 | Method for rapid switching between a high current mode and a low current mode in a charged particle beam system | — | 2016-02-09 |
| 9123500 | Automated ion beam idle | Sean Kellogg, Jiri Zbranek | 2015-09-01 |
| 9105438 | Imaging and processing for plasma ion source | Sean Kellogg, Shouyin Zhang, Mostafa Maazouz, Anthony Graupera | 2015-08-11 |
| 8723143 | Plasma igniter for an inductively coupled plasma ion source | Anthony Graupera, Sean Kellogg, Dustin Laur, Shouyin Zhang, Antonius Bastianus Wilhelmus Dirriwachter | 2014-05-13 |
| 8624206 | Pattern modification schemes for improved FIB patterning | Gene Mirro, Cornelis Sander Kooijman, Hendrik Jan de Vos | 2014-01-07 |
| 8445870 | Charged particle beam system having multiple user-selectable operating modes | Shouyin Zhang, Sean Kellog, Anthony Graupera | 2013-05-21 |
| 8314409 | Pattern modification schemes for improved FIB patterning | Gene Mirro, Cornelis Sander Kooijman, Hendrik Jan de Vos | 2012-11-20 |
| 8253118 | Charged particle beam system having multiple user-selectable operating modes | Shouyin Zhang, Sean Kellogg, Anthony Graupera | 2012-08-28 |
| 8183547 | Dual beam system | — | 2012-05-22 |
| 8124942 | Plasma igniter for an inductively coupled plasma ion source | Anthony Graupera, Sean Kellogg, Dustin Laur, Shouyin Zhang, Antonius Bastianus Wilhelmus Dirriwachter | 2012-02-28 |
| 7714300 | High-speed high-efficiency solid-state electron detector | Mark A. McCord, David L. Brown | 2010-05-11 |
| 6448804 | Contactless total charge measurement with corona | Roger L. Verkuil, Gregory S. Horner | 2002-09-10 |
| 6335630 | Contactless method for measuring total charge of an oxide layer on a semiconductor wafer using corona charge | Roger L. Verkuil, Gregory S. Horner | 2002-01-01 |
| 6202029 | Non-contact electrical conduction measurement for insulating films | Roger L. Verkuil, Gregory S. Horner | 2001-03-13 |