| 12471849 |
Systems, devices and methods for analyte monitoring system |
Douglas William Burnette, Hari Hampapuram, Apurv Ullas Kamath, Shawn Larvenz, Aditya Mandapaka +4 more |
2025-11-18 |
|
| 12396663 |
Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user |
Jose Hector Hernandez-Rosas, Mark Dervaes, Peter C. Simpson, Apurv Ullas Kamath, Shawn Larvenz +1 more |
2025-08-26 |
|
| 12310723 |
Advanced continuous analyte monitoring system |
Sebastian Bohm, Mark Dervaes, Eric Johnson, Apurv Ullas Kamath, Shawn Larvenz +11 more |
2025-05-27 |
|
| 12303262 |
Advanced continuous analyte monitoring system |
Sebastian Bohm, Mark Dervaes, Eric Johnson, Apurv Ullas Kamath, Shawn Larvenz +11 more |
2025-05-20 |
|
| 11690538 |
Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user |
Jose Hector Hernandez-Rosas, Mark Dervaes, Peter C. Simpson, Apurv Ullas Kamath, Shawn Larvenz +1 more |
2023-07-04 |
|
| 11278244 |
Systems, devices and methods for analyte monitoring system |
Douglas William Burnette, Hari Hampapuram, Apurv Ullas Kamath, Shawn Larvenz, Aditya Mandapaka +4 more |
2022-03-22 |
$384,571,000 |
| 11179069 |
Advanced continuous analyte monitoring system |
Sebastian Bohm, Mark Dervaes, Eric Johnson, Apurv Ullas Kamath, Shawn Larvenz +11 more |
2021-11-23 |
$109,157,000 |
| 10687740 |
Advanced continuous analyte monitoring system |
Sebastian Bohm, Mark Dervaes, Eric Johnson, Apurv Ullas Kamath, Shawn Larvenz +11 more |
2020-06-23 |
$237,814,000 |
| 10362973 |
Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user |
Jose Hector Hernandez-Rosas, Mark Dervaes, Peter C. Simpson, Apurv Ullas Kamath, Shawn Larvenz +1 more |
2019-07-30 |
$81,061,000 |
| 10312162 |
Methods and apparatus for semiconductor sample workflow |
Konstantin J. Balashov |
2019-06-04 |
|
| 10231653 |
Advanced continuous analyte monitoring system |
Sebastian Bohm, Mark Dervaes, Eric Johnson, Apurv Ullas Kamath, Shawn Larvenz +11 more |
2019-03-19 |
$37,147,000 |
| 10052050 |
Systems and methods for monitoring and managing life of a battery in an analyte sensor system worn by a user |
Jose Hector Hernandez-Rosas, Mark Dervaes, Peter C. Simpson, Apurv Ullas Kamath, Shawn Larvenz +1 more |
2018-08-21 |
$42,953,000 |
| 9257261 |
Method for rapid switching between a high current mode and a low current mode in a charged particle beam system |
— |
2016-02-09 |
$8,536,000 |
| 9123500 |
Automated ion beam idle |
Sean Kellogg, Jiri Zbranek |
2015-09-01 |
$8,721,000 |
| 9105438 |
Imaging and processing for plasma ion source |
Sean Kellogg, Shouyin Zhang, Mostafa Maazouz, Anthony Graupera |
2015-08-11 |
$17,670,000 |
| 8723143 |
Plasma igniter for an inductively coupled plasma ion source |
Anthony Graupera, Sean Kellogg, Dustin Laur, Shouyin Zhang, Antonius Bastianus Wilhelmus Dirriwachter |
2014-05-13 |
$16,423,000 |
| 8624206 |
Pattern modification schemes for improved FIB patterning |
Gene Mirro, Cornelis Sander Kooijman, Hendrik Jan de Vos |
2014-01-07 |
$5,114,000 |
| 8445870 |
Charged particle beam system having multiple user-selectable operating modes |
Shouyin Zhang, Sean Kellog, Anthony Graupera |
2013-05-21 |
$8,097,000 |
| 8314409 |
Pattern modification schemes for improved FIB patterning |
Gene Mirro, Cornelis Sander Kooijman, Hendrik Jan de Vos |
2012-11-20 |
$4,186,000 |
| 8253118 |
Charged particle beam system having multiple user-selectable operating modes |
Shouyin Zhang, Sean Kellogg, Anthony Graupera |
2012-08-28 |
$15,011,000 |
| 8183547 |
Dual beam system |
— |
2012-05-22 |
$12,369,000 |
| 8124942 |
Plasma igniter for an inductively coupled plasma ion source |
Anthony Graupera, Sean Kellogg, Dustin Laur, Shouyin Zhang, Antonius Bastianus Wilhelmus Dirriwachter |
2012-02-28 |
$12,876,000 |
| 7714300 |
High-speed high-efficiency solid-state electron detector |
Mark A. McCord, David L. Brown |
2010-05-11 |
$6,521,000 |
| 6448804 |
Contactless total charge measurement with corona |
Roger L. Verkuil, Gregory S. Horner |
2002-09-10 |
|
| 6335630 |
Contactless method for measuring total charge of an oxide layer on a semiconductor wafer using corona charge |
Roger L. Verkuil, Gregory S. Horner |
2002-01-01 |
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