HV

Hendrik Jan de Vos

FE Fei: 3 patents #184 of 681Top 30%
Overall (All Time): #1,479,483 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
10002742 Composite scan path in a charged particle microscope Pavel Potocek, Cornelis Sander Kooijman, Hendrik Nicolaas Slingerland 2018-06-19
9361275 Method for analyzing an EDS signal Cornelis Sander Kooijman 2016-06-07
8624206 Pattern modification schemes for improved FIB patterning Tom Miller, Gene Mirro, Cornelis Sander Kooijman 2014-01-07