HS

Hendrik Nicolaas Slingerland

FE Fei: 11 patents #49 of 681Top 8%
U.S. Philips: 3 patents #1,741 of 8,851Top 20%
UI University Of Illinois: 1 patents #1,166 of 3,009Top 40%
University of California: 1 patents #8,022 of 18,278Top 45%
📍 Venlo, NL: #9 of 548 inventorsTop 2%
Overall (All Time): #313,831 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDate
12155288 Electric motor/generator, vehicle and wind turbine Wouter Jansen 2024-11-26
10453647 Emission noise correction of a charged particle source Ali Mohammadi-Gheidari, Luigi Mele, Peter Christiaan Tiemeijer, Gerard Nicolaas Anne van Veen 2019-10-22
10002742 Composite scan path in a charged particle microscope Pavel Potocek, Cornelis Sander Kooijman, Hendrik Jan de Vos 2018-06-19
9620330 Mathematical image assembly in a scanning-type microscope Pavel Poto{hacek over (c)}ek, Cornelis Sander Kooijman, Gerard Nicolaas Anne van Veen, Faysal Boughorbel 2017-04-11
9153414 Particle optical apparatus with a predetermined final vacuum pressure William Ralph Knowles 2015-10-06
8757873 Method of measuring the temperature of a sample carrier in a charged particle-optical apparatus Stephanus Hubertus Leonardus van den Boom, Pleun Dona, Laurens Franz Taemsz Kwakman, Uwe Luecken, Hervé-William Rémigy +2 more 2014-06-24
8692196 Method of use for a multipole detector for a transmission electron microscope Peter Christiaan Tiemeijer, Uwe Luecken, Alan Frank de Jong 2014-04-08
8569712 Beam blanker for interrupting a beam of charged particles Guido Knippels, Fredericus Bernardus Kiewiet, Pieter Kruit, Benjamin John Cook, Jacques Nonhebel 2013-10-29
8306291 Method for localizing labels in a sample 2012-11-06
8071954 Hybrid phase plate Raymond Wagner, Frank Jeroen Pieter Schuurmans, Peter Christiaan Tiemeijer 2011-12-06
7884326 Manipulator for rotating and translating a sample holder Jeroen van de Water, Johannes Antonius Maria van den Oetelaar, Raymond Wagner, Jan Willem Bruggers, Adriaan Huibert Dirk Ottevanger +5 more 2011-02-08
7301157 Cluster tool for microscopic processing of samples Bart Buijsse, Mark Meuwese, Bernardus Jacobus Marie Bormans, Hendrik Gezinus Tappel 2007-11-27
5111054 Heat-actuated vacuum valve for a particle beam apparatus 1992-05-05
5093578 Valve device for a particle beam apparatus Hendrik Gezinus Tappel 1992-03-03
4820898 Ion beam apparatus for finishing patterns 1989-04-11