PP

Pavel Potocek

FE Fei: 26 patents #6 of 681Top 1%
Overall (All Time): #141,232 of 4,157,543Top 4%
27
Patents All Time

Issued Patents All Time

Showing 25 most recent of 27 patents

Patent #TitleCo-InventorsDate
12392735 Sparse image reconstruction from neighboring tomography tilt images Maurice Peemen, Holger Kohr 2025-08-19
12288667 Live-assisted image acquisition method and system with charged particle microscopy Bert Henning Freitag, Maurice Peemen 2025-04-29
12223752 Data acquisition in charged particle microscopy Ondrej Machek, Tereza Konečná 2025-02-11
12175648 Method implemented by a data processing apparatus, and charged particle beam device for inspecting a specimen using such a method Remco Schoenmakers, Maurice Peemen 2024-12-24
12136532 Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging Remco Schoenmakers, Maurice Peemen, Bert Henning Freitag 2024-11-05
12085523 Adaptive specimen image acquisition using an artificial neural network 2024-09-10
12002194 Training an artificial neural network using simulated specimen images Ond{hacek over (r)}ej Machek, Tomá{hacek over (s)} Vystav{hacek over (e)}l, Libor Strako{hacek over (s)} 2024-06-04
11982634 Adaptive specimen image acquisition 2024-05-14
11741730 Charged particle microscope scan masking for three-dimensional reconstruction Maurice Peemen, Bert Henning Freitag 2023-08-29
11488800 Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging Remco Schoenmakers, Maurice Peemen, Bert Henning Freitag 2022-11-01
11482400 Method, device and system for remote deep learning for microscopic image reconstruction and segmentation Remco Schoenmakers, Maurice PEEMAN, Faysal Boughorbel 2022-10-25
11380529 Depth reconstruction for 3D images of samples in a charged particle system Milo{hacek over (s)} Hovorka, Maurice Peemen, Luká{hacek over (s)} Hübner 2022-07-05
11355305 Low keV ion beam image restoration by machine learning for object localization Remco Johannes Petrus Geurts, Maurice Peemen, Ondrej Machek 2022-06-07
11282670 Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample images Luká{hacek over (s)} Hübner, Milo{hacek over (s)} Hovorka, Erik René Kieft 2022-03-22
10928335 Adaptive specimen image acquisition using an artificial neural network 2021-02-23
10903043 Method, device and system for remote deep learning for microscopic image reconstruction and segmentation Remco Schoenmakers, Maurice Peemen, Faysal Boughorbel 2021-01-26
10846845 Training an artificial neural network using simulated specimen images Ond{hacek over (r)}ej Machek, Tomá{hacek over (s)} Vystav{hacek over (e)}l, Libor Strako{hacek over (s)} 2020-11-24
10811223 Method of analyzing surface modification of a specimen in a charged-particle microscope Faysal Boughorbel, Mathijs Petrus Wilhelmus van den Boogaard, Emine Korkmaz 2020-10-20
10614998 Charge reduction by digital image correlation Remco Johannes Petrus Geurts, Brad Larson 2020-04-07
10128080 Three-dimensional imaging in charged-particle microscopy Faysal Boughorbel, Ingo Gestmann 2018-11-13
10115561 Method of analyzing surface modification of a specimen in a charged-particle microscope Faysal Boughorbel, Mathijs Petrus Wilhelmus van den Boogaard, Emine Korkmaz 2018-10-30
10002742 Composite scan path in a charged particle microscope Cornelis Sander Kooijman, Hendrik Jan de Vos, Hendrik Nicolaas Slingerland 2018-06-19
9934936 Charged particle microscope with special aperture plate Franciscus Martinus Henricus Maria van Laarhoven, Faysal Boughorbel, Remco Schoenmakers, Peter Christiaan Tiemeijer 2018-04-03
9711325 Charged-particle microscope providing depth-resolved imagery Faysal Boughorbel, Eric Gerardus Theodoor Bosch, Xiaodong Zhuge, Berend Helmerus Lich 2017-07-18
9478393 Computational scanning microscopy with improved resolution Faysal Boughorbel, Berend Helmerus Lich, Matthias Langhorst 2016-10-25