Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12288667 | Live-assisted image acquisition method and system with charged particle microscopy | Pavel Potocek, Maurice Peemen | 2025-04-29 |
| 12136532 | Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging | Pavel Potocek, Remco Schoenmakers, Maurice Peemen | 2024-11-05 |
| 11741730 | Charged particle microscope scan masking for three-dimensional reconstruction | Pavel Potocek, Maurice Peemen | 2023-08-29 |
| 11488800 | Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging | Pavel Potocek, Remco Schoenmakers, Maurice Peemen | 2022-11-01 |
| 11211223 | System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy | Ivan Lazic, Stefano Vespucci, Eric Gerardus Theodoor Bosch | 2021-12-28 |
| 11127562 | System and method for RF pulsed electron beam based STEM | Erik René Kieft | 2021-09-21 |
| 10832901 | EELS detection technique in an electron microscope | Sorin Lazar, Stephan Kujawa, Maarten Kuijper, Gerard Nicolaas Anne van Veen, Peter Christiaan Tiemeijer +1 more | 2020-11-10 |
| 10224174 | Transmission charged particle microscope with imaging beam rotation | Peter Christiaan Tiemeijer, Maarten Bischoff | 2019-03-05 |
| 8993963 | Mounting structures for multi-detector electron microscopes | Hanno Sebastian von Harrach, Pleun Dona | 2015-03-31 |
| 8859966 | Simultaneous electron detection | Peter Christiaan Tiemeijer, Sorin Lazar | 2014-10-14 |
| 8592764 | X-ray detector for electron microscope | Hanno Sebastian von Harrach, Pleun Dona | 2013-11-26 |
| 8410439 | X-ray detector for electron microscope | Hanno Sebastian von Harrach, Pleun Dona | 2013-04-02 |
| 8405027 | Contrast for scanning confocal electron microscope | Sorin Lazar, Peter Christiaan Tiemeijer | 2013-03-26 |
| 8389936 | Method for inspecting a sample | Georg Alexander Rosenthal, Daniel Woodrow Phifer, Jr. | 2013-03-05 |
| 8168948 | Method of machining a work piece with a focused particle beam | Aurelien Philippe Jean Maclou Botman, Johannes Jacobus Lambertus Mulders | 2012-05-01 |
| 8080791 | X-ray detector for electron microscope | Hanno Sebastian von Harrach, Pleun Dona | 2011-12-20 |
| 7825378 | Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus | Alevtyna Yakushevska, Erwan Sourty, Uwe Luecken | 2010-11-02 |
| 7518121 | Method for determining lens errors in a particle-optical device | Diederik Jan Maas, Sjoerd Antonius Maria Mentink, Jeroen Jan Lambertus Horikx | 2009-04-14 |