Issued Patents All Time
Showing 1–25 of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12255045 | Transmission charged particle microscope with an electron energy loss spectroscopy detector | — | 2025-03-18 |
| 12176179 | Method, device and system for reducing off-axial aberration in electron microscopy | Maarten Bischoff, Tjerk G. Spanjer, Stan Johan Pieter Konings | 2024-12-24 |
| 12100585 | Energy spectrometer with dynamic focus | Arthur Reinout Hartong, Alexander Henstra, Sorin Lazar | 2024-09-24 |
| 11988618 | Method and system to determine crystal structure | Bart Buijsse, Hans Raaijmakers | 2024-05-21 |
| 11955310 | Transmission charged particle microscope with an electron energy loss spectroscopy detector | — | 2024-04-09 |
| 11948771 | Method of determining an energy width of a charged particle beam | — | 2024-04-02 |
| 11817290 | Method, device and system for reducing off-axial aberration in electron microscopy | Maarten Bischoff, Tjerk G. Spanjer, Stan Johan Pieter Konings | 2023-11-14 |
| 11810751 | Method of imaging a specimen using a transmission charged particle microscope | Evgeniia Pechnikova, Rudolf Geurink, Abhay Kotecha, Jamie McCormack | 2023-11-07 |
| 11804357 | Electron optical module for providing an off-axial electron beam with a tunable coma | Ali Mohammadi-Gheidari, Alexander Henstra, Tomas Radlicka | 2023-10-31 |
| 11715618 | System and method for reducing the charging effect in a transmission electron microscope system | Yuchen Deng, Alexander Henstra | 2023-08-01 |
| 11587759 | Method, device and system for reducing off-axial aberration in electron microscopy | Maarten Bischoff, Tjerk G. Spanjer, Stan Johan Pieter Konings | 2023-02-21 |
| 11450505 | Magnetic field free sample plane for charged particle microscope | Alexander Henstra, Ali Mohammadi-Gheidari | 2022-09-20 |
| 11114271 | Sixth-order and above corrected STEM multipole correctors | Alexander Henstra, Marcel Niestadt | 2021-09-07 |
| 11024483 | Transmission charged particle microscope with adjustable beam energy spread | — | 2021-06-01 |
| 10971326 | Multi-electron-beam imaging apparatus with improved performance | Ali Mohammadi-Gheidari, Erik René Kieft, Gerard Nicolaas Anne van Veen | 2021-04-06 |
| 10923308 | Method and system for energy resolved chroma imaging | Yuchen Deng, Holger Kohr, Jaydeep Sanjay Belapure | 2021-02-16 |
| 10832901 | EELS detection technique in an electron microscope | Bert Henning Freitag, Sorin Lazar, Stephan Kujawa, Maarten Kuijper, Gerard Nicolaas Anne van Veen +1 more | 2020-11-10 |
| 10559448 | Transmission charged particle microscope with improved EELS/EFTEM module | Alexander Henstra | 2020-02-11 |
| 10522323 | Electron energy loss spectroscopy with adjustable energy resolution | — | 2019-12-31 |
| 10453647 | Emission noise correction of a charged particle source | Ali Mohammadi-Gheidari, Luigi Mele, Gerard Nicolaas Anne van Veen, Hendrik Nicolaas Slingerland | 2019-10-22 |
| 10431420 | Post column filter with enhanced energy range | Alexander Henstra | 2019-10-01 |
| 10410827 | Gun lens design in a charged particle microscope | Ali Mohammadi-Gheidari, Alexander Henstra, Kun Liu, Pleun Dona, Gregory A. Schwind +1 more | 2019-09-10 |
| 10224174 | Transmission charged particle microscope with imaging beam rotation | Bert Henning Freitag, Maarten Bischoff | 2019-03-05 |
| 10157727 | Aberration measurement in a charged particle microscope | Alexander Henstra | 2018-12-18 |
| 9991087 | Spectroscopy in a transmission charged-particle microscope | Erwin de Jong, Sorin Lazar, Rudolf Geurink | 2018-06-05 |