Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12176179 | Method, device and system for reducing off-axial aberration in electron microscopy | Maarten Bischoff, Peter Christiaan Tiemeijer, Tjerk G. Spanjer | 2024-12-24 |
| 11817290 | Method, device and system for reducing off-axial aberration in electron microscopy | Maarten Bischoff, Peter Christiaan Tiemeijer, Tjerk G. Spanjer | 2023-11-14 |
| 11587759 | Method, device and system for reducing off-axial aberration in electron microscopy | Maarten Bischoff, Peter Christiaan Tiemeijer, Tjerk G. Spanjer | 2023-02-21 |
| 9658246 | Method of studying a sample in an ETEM | Stephan Kujawa, Petrus Hubertus Franciscus Trompenaars | 2017-05-23 |
| 9570270 | Method of using an environmental transmission electron microscope | Peter Christiaan Tiemeijer, Alexander Henstra | 2017-02-14 |