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Alexander Henstra — 45 Patents

FEFei: 36 patents #3 of 681Top 1%

U.S. Philips: 5 patents #925 of 8,851Top 15%

Philips: 1 patents #3,761 of 7,731Top 50%

POPhilips Electron Optics: 1 patents #3 of 7Top 45%

Overall (All Time): #64,393 of 4,157,543Top 2%

45 Patents All Time

Alexander Henstra has been granted 45 US patents while listed as an inventor at Fei. The first was granted in 1996 and the most recent in December 2025. Alexander Henstra ranks #64,393 of 4,157,543 US inventors in our database (top 1.5%). Patent records list Alexander Henstra in Utrecht, OR, NL.

Patents per Year

Issued Patents All Time

Showing 1–25 of 45 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12505996	EELS auto-alignment using full image simulation	Peter Christiaan Tiemeijer	2025-12-23
12505975	Focused ion beam system and method	Galen Gledhill	2025-12-23
12394587	Simple spherical aberration corrector for SEM	Ali Mohammadi-Gheidari, Luigi Mele	2025-08-19
12362132	Simple spherical aberration corrector for SEM	Ali Mohammadi-Gheidari	2025-07-15
12216068	Bifocal electron microscope	Yuchen Deng, Holger Kohr	2025-02-04
12100585	Energy spectrometer with dynamic focus	Arthur Reinout Hartong, Sorin Lazar, Peter Christiaan Tiemeijer	2024-09-24
11915904	Reduction of thermal magnetic field noise in TEM corrector systems	Pleun Dona	2024-02-27
11906450	Electron diffraction holography	Yuchen Deng, Holger Kohr	2024-02-20
11815476	Methods and systems for acquiring three-dimensional electron diffraction data	Bart Buijsse, Jaydeep Sanjay Belapure, Michael Patrick Janus, Stefano Vespucci	2023-11-14
11804357	Electron optical module for providing an off-axial electron beam with a tunable coma	Ali Mohammadi-Gheidari, Peter Christiaan Tiemeijer, Tomas Radlicka	2023-10-31
11715618	System and method for reducing the charging effect in a transmission electron microscope system	Yuchen Deng, Peter Christiaan Tiemeijer	2023-08-01
11460419	Electron diffraction holography	Yuchen Deng, Holger Kohr	2022-10-04
11456149	Methods and systems for acquiring 3D diffraction data	Bart Buijsse, Yuchen Deng	2022-09-27
11450505	Magnetic field free sample plane for charged particle microscope	Ali Mohammadi-Gheidari, Peter Christiaan Tiemeijer	2022-09-20
11437216	Reduction of thermal magnetic field noise in TEM corrector systems	Pleun Dona	2022-09-06
11404241	Simultaneous TEM and STEM microscope	Yuchen Deng, Holger Kohr	2022-08-02
11239045	Method and system for correcting two-fold, fifth-order parasitic aberrations in charged particle systems	Marcel Niestadt	2022-02-01
11183364	Dual beam microscope system for imaging during sample processing	Yuchen Deng, Petrus Hubertus Franciscus Trompenaars, Bart Buijsse	2021-11-23
11114271	Sixth-order and above corrected STEM multipole correctors	Peter Christiaan Tiemeijer, Marcel Niestadt	2021-09-07
10825644	Corrector transfer optics for Lorentz EM	—	2020-11-03
10559448	Transmission charged particle microscope with improved EELS/EFTEM module	Peter Christiaan Tiemeijer	2020-02-11
10431420	Post column filter with enhanced energy range	Peter Christiaan Tiemeijer	2019-10-01	$3,362,000
10410827	Gun lens design in a charged particle microscope	Ali Mohammadi-Gheidari, Peter Christiaan Tiemeijer, Kun Liu, Pleun Dona, Gregory A. Schwind +1 more	2019-09-10	$4,455,000
10157727	Aberration measurement in a charged particle microscope	Peter Christiaan Tiemeijer	2018-12-18
9978561	Post column filter with enhanced energy range	Peter Christiaan Tiemeijer	2018-05-22