Issued Patents All Time
Showing 25 most recent of 43 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12394587 | Simple spherical aberration corrector for SEM | Ali Mohammadi-Gheidari, Luigi Mele | 2025-08-19 |
| 12362132 | Simple spherical aberration corrector for SEM | Ali Mohammadi-Gheidari | 2025-07-15 |
| 12216068 | Bifocal electron microscope | Yuchen Deng, Holger Kohr | 2025-02-04 |
| 12100585 | Energy spectrometer with dynamic focus | Arthur Reinout Hartong, Sorin Lazar, Peter Christiaan Tiemeijer | 2024-09-24 |
| 11915904 | Reduction of thermal magnetic field noise in TEM corrector systems | Pleun Dona | 2024-02-27 |
| 11906450 | Electron diffraction holography | Yuchen Deng, Holger Kohr | 2024-02-20 |
| 11815476 | Methods and systems for acquiring three-dimensional electron diffraction data | Bart Buijsse, Jaydeep Sanjay Belapure, Michael Patrick Janus, Stefano Vespucci | 2023-11-14 |
| 11804357 | Electron optical module for providing an off-axial electron beam with a tunable coma | Ali Mohammadi-Gheidari, Peter Christiaan Tiemeijer, Tomas Radlicka | 2023-10-31 |
| 11715618 | System and method for reducing the charging effect in a transmission electron microscope system | Yuchen Deng, Peter Christiaan Tiemeijer | 2023-08-01 |
| 11460419 | Electron diffraction holography | Yuchen Deng, Holger Kohr | 2022-10-04 |
| 11456149 | Methods and systems for acquiring 3D diffraction data | Bart Buijsse, Yuchen Deng | 2022-09-27 |
| 11450505 | Magnetic field free sample plane for charged particle microscope | Ali Mohammadi-Gheidari, Peter Christiaan Tiemeijer | 2022-09-20 |
| 11437216 | Reduction of thermal magnetic field noise in TEM corrector systems | Pleun Dona | 2022-09-06 |
| 11404241 | Simultaneous TEM and STEM microscope | Yuchen Deng, Holger Kohr | 2022-08-02 |
| 11239045 | Method and system for correcting two-fold, fifth-order parasitic aberrations in charged particle systems | Marcel Niestadt | 2022-02-01 |
| 11183364 | Dual beam microscope system for imaging during sample processing | Yuchen Deng, Petrus Hubertus Franciscus Trompenaars, Bart Buijsse | 2021-11-23 |
| 11114271 | Sixth-order and above corrected STEM multipole correctors | Peter Christiaan Tiemeijer, Marcel Niestadt | 2021-09-07 |
| 10825644 | Corrector transfer optics for Lorentz EM | — | 2020-11-03 |
| 10559448 | Transmission charged particle microscope with improved EELS/EFTEM module | Peter Christiaan Tiemeijer | 2020-02-11 |
| 10431420 | Post column filter with enhanced energy range | Peter Christiaan Tiemeijer | 2019-10-01 |
| 10410827 | Gun lens design in a charged particle microscope | Ali Mohammadi-Gheidari, Peter Christiaan Tiemeijer, Kun Liu, Pleun Dona, Gregory A. Schwind +1 more | 2019-09-10 |
| 10157727 | Aberration measurement in a charged particle microscope | Peter Christiaan Tiemeijer | 2018-12-18 |
| 9978561 | Post column filter with enhanced energy range | Peter Christiaan Tiemeijer | 2018-05-22 |
| 9741525 | Charged-particle microscope with astigmatism compensation and energy-selection | Bohuslav Sed'a, Lubomir Tuma | 2017-08-22 |
| 9570270 | Method of using an environmental transmission electron microscope | Peter Christiaan Tiemeijer, Stan Johan Pieter Konings | 2017-02-14 |