Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12080512 | Charged particle microscope for examining a specimen, and method of determining an aberration of said charged particle microscope | — | 2024-09-03 |
| 11417493 | Counter pole with permanent magnets | — | 2022-08-16 |
| 10134563 | Contactless temperature measurement in a charged particle microscope | Jacob Simon Faber, Timothy Burnett, Libor Novak | 2018-11-20 |
| 9741525 | Charged-particle microscope with astigmatism compensation and energy-selection | Bohuslav Sed'a, Alexander Henstra | 2017-08-22 |
| 9741527 | Specimen holder for a charged particle microscope | Tomas Vystavel, Josef Sestak, Pavel Poloucek, Michal Hrouzek, Tomas Trnkocy +1 more | 2017-08-22 |
| 9490100 | Method of using a compound particle-optical lens | Petr Syta{hacek over (r)}, Petr Hlavenka | 2016-11-08 |
| 9362086 | In-column detector for particle-optical column | Petr Hlavenka, Petr Syta{hacek over (r)}, Radek {hacek over (C)}e{hacek over (s)}ka, Bohuslav Sed'a | 2016-06-07 |