JF

Jacob Simon Faber

FE Fei: 6 patents #94 of 681Top 15%
Overall (All Time): #841,726 of 4,157,543Top 25%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
10134563 Contactless temperature measurement in a charged particle microscope Lubomir Tuma, Timothy Burnett, Libor Novak 2018-11-20
9502211 Adaptive scanning for particle size using directed beam signal analysis Cornelis Sander Kooijman 2016-11-22
8597565 Method for forming microscopic 3D structures Johannes Jacobus Lambertus Mulders, Alan Frank de Jong, Carmen Francisca Maria van Vilsteren 2013-12-03
8399831 Forming an image while milling a work piece Remco Theodorus Johannes Petrus Geurts 2013-03-19
7675034 Charged particle instrument equipped with optical microscope 2010-03-09
7362452 Method of adjusting the operating region of a tool component to a pre-determined element 2008-04-22