Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12228484 | Broad ion beam (BIB) systems for more efficient processing of multiple samples | Michal Hrouzek, Krishna Kanth Neelisetty, Petr Wandrol | 2025-02-18 |
| 12216029 | Liquid shaping with charged particle beams | Tomas KAZDA | 2025-02-04 |
| 12183539 | Inert gas sample transfer for beam systems | Petr Glajc, Marek Uncovsky | 2024-12-31 |
| 12165833 | System and methods for automated processing of multiple samples in a BIB system | Michal Hrouzek, Krishna Kanth Neelisetty, Petr Wandrol | 2024-12-10 |
| 12106931 | Systems and methods for pre-aligning samples for more efficient processing of multiple samples with a Broad Ion Beam (BIB) system | Michal Hrouzek, Tomas Vystavel, Krishna Kanth Neelisetty, Jan Neuzil, Ondrej Klvac | 2024-10-01 |
| 12000789 | Method and system for positioning and transferring a sample | Krishna Kanth Neelisetty, Veronika Hammerova, Jan Lasko | 2024-06-04 |
| 11676795 | Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets | Pavel Stejskal, Bohuslav Sed'a, Petr Hlavenka, Jan Stopka | 2023-06-13 |
| 10134563 | Contactless temperature measurement in a charged particle microscope | Jacob Simon Faber, Lubomir Tuma, Timothy Burnett | 2018-11-20 |
| 9679741 | Environmental cell for charged particle beam system | Marek Uncovsky, Milos Toth, Martin Cafourek, William Parker, Marcus Straw +1 more | 2017-06-13 |