Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12183539 | Inert gas sample transfer for beam systems | Libor Novak, Petr Glajc | 2024-12-31 |
| 11335536 | Light guide assembly for an electron microscope | Michal Geryk, Jan Lasko | 2022-05-17 |
| 10978272 | Measurement and endpointing of sample thickness | Tomas Vystavel, Pavel Stejskal | 2021-04-13 |
| 9679741 | Environmental cell for charged particle beam system | Libor Novak, Milos Toth, Martin Cafourek, William Parker, Marcus Straw +1 more | 2017-06-13 |
| 9153416 | Detection method for use in charged-particle microscopy | Petr Hlavenka | 2015-10-06 |
| 8735849 | Detector for use in charged-particle microscopy | Petr Hlavenka | 2014-05-27 |
| 7791020 | Multistage gas cascade amplifier | Milos Toth, William Ralph Knowles | 2010-09-07 |
| 7009187 | Particle detector suitable for detecting ions and electrons | Robert L. Gerlach, Mark W. Utlaut, Trevor Dingle | 2006-03-07 |