| 10715771 |
Wide-gamut-color image formation and projection |
— |
2020-07-14 |
| 8650975 |
Test specimen for testing through-thickness properties |
— |
2014-02-18 |
| 8164059 |
In-chamber electron detector |
Mostafa Maazouz, Trevor Dingle, Mark W. Utlaut, James B. McGinn |
2012-04-24 |
| 7009187 |
Particle detector suitable for detecting ions and electrons |
Mark W. Utlaut, Trevor Dingle, Marek Uncovsky |
2006-03-07 |
| 6977386 |
Angular aperture shaped beam system and method |
Mark W. Utlaut |
2005-12-20 |
| 6949756 |
Shaped and low density focused ion beams |
Mark W. Utlaut, Paul P. Tesch, Richard Young, Clive D. Chandler, Karl D. van der Mast |
2005-09-27 |
| 6946654 |
Collection of secondary electrons through the objective lens of a scanning electron microscope |
Karel Diederick Van Der Mast, Michael R. Scheinfein |
2005-09-20 |
| 6900447 |
Focused ion beam system with coaxial scanning electron microscope |
Mark W. Utlaut, Michael R. Scheinfein |
2005-05-31 |
| 6797969 |
Multi-column FIB for nanofabrication applications |
Paul P. Tesch, Lynwood W. Swanson, Mark W. Utlaut |
2004-09-28 |
| 6797953 |
Electron beam system using multiple electron beams |
Paul P. Tesch, Walter Skoczylas |
2004-09-28 |
| 6710338 |
Focused ion beam system |
Paul P. Tesch, Noel P. Martin, Walter Skoczylas, Drew Procyk |
2004-03-23 |
| 6683320 |
Through-the-lens neutralization for charged particle beam system |
Mark W. Utlaut |
2004-01-27 |
| 6414307 |
Method and apparatus for enhancing yield of secondary ions |
Locke Christman, Mark W. Utlaut |
2002-07-02 |
| 5241182 |
Precision electrostatic lens system and method of manufacture |
Noel Martin |
1993-08-31 |
| 5032724 |
Multichannel charged-particle analyzer |
Ronald E. Negri |
1991-07-16 |
| 4882487 |
Direct imaging monochromatic electron microscope |
— |
1989-11-21 |
| 4810880 |
Direct imaging monochromatic electron microscope |
— |
1989-03-07 |
| 4806754 |
High luminosity spherical analyzer for charged particles |
— |
1989-02-21 |
| 4659899 |
Vacuum-compatible air-cooled plasma device |
David G. Welkie |
1987-04-21 |
| 4412771 |
Sample transport system |
David D. Seibel, Mark C. Miller |
1983-11-01 |
| 4345152 |
Magnetic lens |
— |
1982-08-17 |
| 4296323 |
Secondary emission mass spectrometer mechanism to be used with other instrumentation |
— |
1981-10-20 |
| 4205226 |
Auger electron spectroscopy |
— |
1980-05-27 |
