Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10715771 | Wide-gamut-color image formation and projection | — | 2020-07-14 |
| 8650975 | Test specimen for testing through-thickness properties | — | 2014-02-18 |
| 8164059 | In-chamber electron detector | Mostafa Maazouz, Trevor Dingle, Mark W. Utlaut, James B. McGinn | 2012-04-24 |
| 7009187 | Particle detector suitable for detecting ions and electrons | Mark W. Utlaut, Trevor Dingle, Marek Uncovsky | 2006-03-07 |
| 6977386 | Angular aperture shaped beam system and method | Mark W. Utlaut | 2005-12-20 |
| 6949756 | Shaped and low density focused ion beams | Mark W. Utlaut, Paul P. Tesch, Richard Young, Clive D. Chandler, Karl D. van der Mast | 2005-09-27 |
| 6946654 | Collection of secondary electrons through the objective lens of a scanning electron microscope | Karel Diederick Van Der Mast, Michael R. Scheinfein | 2005-09-20 |
| 6900447 | Focused ion beam system with coaxial scanning electron microscope | Mark W. Utlaut, Michael R. Scheinfein | 2005-05-31 |
| 6797969 | Multi-column FIB for nanofabrication applications | Paul P. Tesch, Lynwood W. Swanson, Mark W. Utlaut | 2004-09-28 |
| 6797953 | Electron beam system using multiple electron beams | Paul P. Tesch, Walter Skoczylas | 2004-09-28 |
| 6710338 | Focused ion beam system | Paul P. Tesch, Noel P. Martin, Walter Skoczylas, Drew Procyk | 2004-03-23 |
| 6683320 | Through-the-lens neutralization for charged particle beam system | Mark W. Utlaut | 2004-01-27 |
| 6414307 | Method and apparatus for enhancing yield of secondary ions | Locke Christman, Mark W. Utlaut | 2002-07-02 |
| 5241182 | Precision electrostatic lens system and method of manufacture | Noel Martin | 1993-08-31 |
| 5032724 | Multichannel charged-particle analyzer | Ronald E. Negri | 1991-07-16 |
| 4882487 | Direct imaging monochromatic electron microscope | — | 1989-11-21 |
| 4810880 | Direct imaging monochromatic electron microscope | — | 1989-03-07 |
| 4806754 | High luminosity spherical analyzer for charged particles | — | 1989-02-21 |
| 4659899 | Vacuum-compatible air-cooled plasma device | David G. Welkie | 1987-04-21 |
| 4412771 | Sample transport system | David D. Seibel, Mark C. Miller | 1983-11-01 |
| 4345152 | Magnetic lens | — | 1982-08-17 |
| 4296323 | Secondary emission mass spectrometer mechanism to be used with other instrumentation | — | 1981-10-20 |
| 4205226 | Auger electron spectroscopy | — | 1980-05-27 |