RY

Richard Young

FE Fei: 19 patents #16 of 681Top 3%
IG Instrument Systems Optische Messtechnik Gmbh: 1 patents #5 of 22Top 25%
NE Neotronics: 1 patents #4 of 9Top 45%
CO Comcast: 1 patents #2,409 of 4,447Top 55%
Overall (All Time): #89,725 of 4,157,543Top 3%
37
Patents All Time

Issued Patents All Time

Showing 25 most recent of 37 patents

Patent #TitleCo-InventorsDate
11847813 Artificial intelligence-enabled preparation end-pointing Thomas G. Miller, John Flanagan, Brian Roberts Routh, Jr., Brad Larson, Aditee Shrotre 2023-12-19
11176656 Artificial intelligence-enabled preparation end-pointing Thomas G. Miller, John Flanagan, Brian Roberts Routh, Jr., Brad Larson, Aditee Shrotre 2021-11-16
10825651 Automated TEM sample preparation Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Thomas G. Miller +3 more 2020-11-03
10340119 Automated TEM sample preparation Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Thomas G. Miller +3 more 2019-07-02
10302489 Method for calibrating a spectroradiometer Felix Frank, Juliane Kraft, Reto Haring 2019-05-28
9601313 Automated TEM sample preparation Valerie Brogden, Jeffrey Blackwood, Michael Schmidt, Dhruti Trivedi, Thomas G. Miller +3 more 2017-03-21
9368325 TEM sample preparation 2016-06-14
9184025 Measurement and endpointing of sample thickness Brennan Peterson, Rudolf Johannes Peter Gerardus Schampers, Michael Moriarty 2015-11-10
9087366 High accuracy beam placement for local area navigation Chad Rue, Peter D. Carleson, Reinier Louis Warschauer 2015-07-21
9040908 Plan view sample preparation 2015-05-26
8995745 Sequencer for combining automated and manual-assistance jobs in a charged particle beam device Ryan Tanner, Reinier Louis Warschauer 2015-03-31
8781219 High accuracy beam placement for local area navigation Reinier Louis Warschauer, Chad Rue, Peter D. Carleson 2014-07-15
8598542 Charged particle beam processing Milos Toth, Alexander Henstra, Alan Frank de Jong, Johannes Jacobus Lambertus Mulders 2013-12-03
8358832 High accuracy beam placement for local area navigation Chad Rue, Peter D. Carleson 2013-01-22
8326346 System and method for battery conservation in a portable device Christopher Chambers 2012-12-04
8170832 Measurement and endpointing of sample thickness Brennan Peterson, Rudolf Johannes Peter Gerardus Schampers, Michael Moriarty 2012-05-01
8059918 High accuracy beam placement for local area navigation Chad Rue, Peter D. Carleson 2011-11-15
7710282 Apparatus for flow detection, measurement and control and method for use of same 2010-05-04
RE40933 Apparatus for flow detection, measurement and control and method for use of same 2009-10-13
7592921 Apparatus for flow detection, measurement and control and method for use of same 2009-09-22
7474419 Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus Hendrik Gezinus Tappel, Ian Johannes Bernardus van Hees, Danny Lankers, Gerard Nicolaas Anne van Veen, Lucille A. Giannuzzi 2009-01-06
7442924 Repetitive circumferential milling for sample preparation Lucille A. Giannuzzi, Paul Anzalone, Daniel Woodrow Phifer, Jr. 2008-10-28
7225052 Method for simultaneously preparing pharmacy vial label and drug-specific warning labels Richard W. Foote 2007-05-29
7221281 Apparatus for flow detection, measurement and control and method for use of same 2007-05-22
6949756 Shaped and low density focused ion beams Robert L. Gerlach, Mark W. Utlaut, Paul P. Tesch, Clive D. Chandler, Karl D. van der Mast 2005-09-27