RS

Rudolf Johannes Peter Gerardus Schampers

FE Fei: 10 patents #53 of 681Top 8%
📍 Tegelen, NL: #1 of 34 inventorsTop 3%
Overall (All Time): #513,418 of 4,157,543Top 15%
10
Patents All Time

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDate
10475629 Charged-particle microscope with in situ deposition functionality John Mitchels, Michal Hrouzek, Tomas Gardelka 2019-11-12
9512460 Method of studying a cryogenic sample in an optical microscope Tobias Mayer, Rainer Daum, Matthias Geisbauer, Johannes Antonius Hendricus Wilhelmus Gerardus Persoon 2016-12-06
9184025 Measurement and endpointing of sample thickness Richard Young, Brennan Peterson, Michael Moriarty 2015-11-10
9142384 Method of welding a frozen aqueous sample to a microprobe Johannes Antonius Hendricus Wilhelmus Gerardus Persoon, Andreas Theodorus Engelen 2015-09-22
8921785 Cooperating capillary and cap for use in a high-pressure freezer Johannes Antonius Hendricus Wilhelmus Gerardus Persoon, Andreas Theodorus Engelen 2014-12-30
8884248 Forming a vitrified sample for electron microscopy Johannes Jacobus Lambertus Mulders, Petrus Hubertus Franciscus Trompenaars 2014-11-11
8754384 Sample preparation stage Johannes Antonius Hendricus Wilhelmus Gerardus Persoon, Andreas Theodorus Engelen, Mathijs Petrus Wilhelmus van den Boogaard, Michael Frederick Hayles 2014-06-17
8674323 Forming an electron microscope sample from high-pressure frozen material Michael Frederick Hayles, Dirk Arie Mattheus de Winter, Christianus Thomas Wilhelmus Maria Schneijdenberg 2014-03-18
8170832 Measurement and endpointing of sample thickness Richard Young, Brennan Peterson, Michael Moriarty 2012-05-01
7615745 Method for separating a minute sample from a work piece Theodorus Adrianus Petrus Verkleij, Hendrik Siewerd Venema 2009-11-10