TG

Tomas Gardelka

FE Fei: 1 patents #375 of 681Top 60%
Overall (All Time): #4,148,592 of 4,157,543Top 100%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10475629 Charged-particle microscope with in situ deposition functionality John Mitchels, Rudolf Johannes Peter Gerardus Schampers, Michal Hrouzek 2019-11-12