JM

John Mitchels

FE Fei: 4 patents #139 of 681Top 25%
Overall (All Time): #1,110,315 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12020895 Systems and apparatuses for contamination-free vacuum transfer of samples Jakub Kuba, Jakub Drahotsky, Michal Valík 2024-06-25
11802823 System and method for handling cryo-charged particle samples Vojt{hacek over (e)}ch Dole{hacek over (z)}al, Hans Persoon 2023-10-31
10475629 Charged-particle microscope with in situ deposition functionality Rudolf Johannes Peter Gerardus Schampers, Michal Hrouzek, Tomas Gardelka 2019-11-12
10170275 Cryogenic specimen processing in a charged particle microscope Tomá{hacek over (s)} Vystav{hacek over (e)}l, Martin Cafourek 2019-01-01