Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Charged-particle microscope with in situ deposition functionality

Charged-particle microscope with in situ deposition functionality

US Patent 10475629 · Granted Nov 12, 2019

Estimated economic value: $2,973,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Broad ion beam (BIB) systems for more efficient processing of multiple samples2025
System and methods for automated processing of multiple samples in a BIB system2024
Systems and methods for pre-aligning samples for more efficient processing of mu2024
Systems and apparatuses for contamination-free vacuum transfer of samples2024
System and method for handling cryo-charged particle samples2023
Cryogenic specimen processing in a charged particle microscope2019
Specimen holder for a charged particle microscope2017
Method of studying a cryogenic sample in an optical microscope2016
Measurement and endpointing of sample thickness2015
Method of welding a frozen aqueous sample to a microprobe2015
Cooperating capillary and cap for use in a high-pressure freezer2014
Forming a vitrified sample for electron microscopy2014