Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12228484 | Broad ion beam (BIB) systems for more efficient processing of multiple samples | Krishna Kanth Neelisetty, Petr Wandrol, Libor Novak | 2025-02-18 |
| 12165833 | System and methods for automated processing of multiple samples in a BIB system | Libor Novak, Krishna Kanth Neelisetty, Petr Wandrol | 2024-12-10 |
| 12106931 | Systems and methods for pre-aligning samples for more efficient processing of multiple samples with a Broad Ion Beam (BIB) system | Libor Novak, Tomas Vystavel, Krishna Kanth Neelisetty, Jan Neuzil, Ondrej Klvac | 2024-10-01 |
| 10475629 | Charged-particle microscope with in situ deposition functionality | John Mitchels, Rudolf Johannes Peter Gerardus Schampers, Tomas Gardelka | 2019-11-12 |
| 9741527 | Specimen holder for a charged particle microscope | Tomas Vystavel, Josef Sestak, Pavel Poloucek, Lubomir Tuma, Tomas Trnkocy +1 more | 2017-08-22 |