Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12431322 | System and method for handling samples for study in a charged particle apparatus, such as a transmission electron microscope | Jiri Benda, Vojtěch Doležal, Jaroslav Hadzima, Martin Čechmánek, Ondrej Shanel | 2025-09-30 |
| 9741527 | Specimen holder for a charged particle microscope | Tomas Vystavel, Josef Sestak, Pavel Poloucek, Lubomir Tuma, Michal Hrouzek +1 more | 2017-08-22 |