OS

Ondrej Shanel

FE Fei: 6 patents #94 of 681Top 15%
📍 Brno, CZ: #59 of 750 inventorsTop 8%
Overall (All Time): #789,643 of 4,157,543Top 20%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
12431322 System and method for handling samples for study in a charged particle apparatus, such as a transmission electron microscope Jiri Benda, Vojtěch Doležal, Tomas Trnkocy, Jaroslav Hadzima, Martin Čechmánek 2025-09-30
11587762 Device and method for determining a property of a sample that is to be used in a charged particle microscope Maarten Kuijper, Matthijn Robert-Jan Vos, Peet Goedendorp 2023-02-21
11430633 Illumination apertures for extended sample lifetimes in helical tomography Trond Karsten Varslot, Martin Schneider, Maarten Kuijper, Ondrej R. Baco, Václav Batelka 2022-08-30
11101104 Multi modal cryo compatible GUID grid Maarten Kuijper, Mathijs Petrus Wilhelmus van den Boogaard, Pleun Dona 2021-08-24
10520454 Innovative X-ray source for use in tomographic imaging Petr Strelec 2019-12-31
9595359 Magnetic lens for focusing a beam of charged particles 2017-03-14