Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11587762 | Device and method for determining a property of a sample that is to be used in a charged particle microscope | Maarten Kuijper, Matthijn Robert-Jan Vos, Ondrej Shanel | 2023-02-21 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11587762 | Device and method for determining a property of a sample that is to be used in a charged particle microscope | Maarten Kuijper, Matthijn Robert-Jan Vos, Ondrej Shanel | 2023-02-21 |