Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12002194 | Training an artificial neural network using simulated specimen images | Ond{hacek over (r)}ej Machek, Libor Strako{hacek over (s)}, Pavel Potocek | 2024-06-04 |
| 11815479 | Method of examining a sample using a charged particle beam apparatus | Oleksii Kaplenko, Ond{hacek over (r)}ej Machek, Jan Klusá{hacek over (c)}ek, Kristýna Bukvi{hacek over (s)}ová, Mykola Kaplenko | 2023-11-14 |
| 11499926 | Method for diffraction pattern acquisition | Zuzana Hlavenková | 2022-11-15 |
| 11195693 | Method and system for dynamic band contrast imaging | Pavel Stejskal | 2021-12-07 |
| 11017980 | Method of manipulating a sample in an evacuated chamber of a charged particle apparatus | Petronella Catharina Maria Baken, Ernst Jan Ruben Vesseur, Pavel Poloucek | 2021-05-25 |
| 10846845 | Training an artificial neural network using simulated specimen images | Ond{hacek over (r)}ej Machek, Libor Strako{hacek over (s)}, Pavel Potocek | 2020-11-24 |
| 10784076 | 3D defect characterization of crystalline samples in a scanning type electron microscope | Bohuslav Sed'a, Anna Prokhodtseva | 2020-09-22 |
| 10504689 | Method for sample orientation for TEM lamella preparation | Libor Strako{hacek over (s)}, Anna Prokhodtseva, Jaromir Va{hacek over (n)}hara, Jaroslav Stárek | 2019-12-10 |
| 10170275 | Cryogenic specimen processing in a charged particle microscope | John Mitchels, Martin Cafourek | 2019-01-01 |
| 9958403 | Arrangement for X-Ray tomography | Pavel Stejskal, Marek Un{hacek over (c)}ovský, Alan Frank de Jong, Bart Buijsse, Pierre Bleuet | 2018-05-01 |
| 9762863 | Method of sampling a sample and displaying obtained information | Pavel Poto{hacek over (c)}ek, Martinus P. M. Bierhoff, Luká{hacek over (s)} Dryb{hacek over (c)}ák | 2017-09-12 |
| 9618463 | Method of acquiring EBSP patterns | Marek Un{hacek over (c)}ovský, Pavel Stejskal | 2017-04-11 |