Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10784076 | 3D defect characterization of crystalline samples in a scanning type electron microscope | Tomá{hacek over (s)} Vystav{hacek over (e)}l, Bohuslav Sed'a | 2020-09-22 |
| 10504689 | Method for sample orientation for TEM lamella preparation | Tomá{hacek over (s)} Vystav{hacek over (e)}l, Libor Strako{hacek over (s)}, Jaromir Va{hacek over (n)}hara, Jaroslav Stárek | 2019-12-10 |