Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12380596 | Method and system for determining beam position | Jan Stopka, Radovan Vašina, Radim SEJNOHA | 2025-08-05 |
| 12106933 | Method to correct first order astigmatism and first order distortion in multi-beam scanning electron microscopes | Jan Stopka | 2024-10-01 |
| 12057287 | Methods and systems for aligning a multi-beam system | Jan Stopka, Radovan Va{hacek over (s)}ina, Radim {hacek over (S)}ejnoha | 2024-08-06 |
| 11676795 | Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets | Pavel Stejskal, Petr Hlavenka, Libor Novak, Jan Stopka | 2023-06-13 |
| 10937627 | Multi-beam electron microscope | Pavel Stejskal, Petr Hlavenka | 2021-03-02 |
| 10790113 | Multi-beam charged particle imaging apparatus | Ali Mohammadi-Gheidari, Marek Un{hacek over (c)}ovský | 2020-09-29 |
| 10784076 | 3D defect characterization of crystalline samples in a scanning type electron microscope | Tomá{hacek over (s)} Vystav{hacek over (e)}l, Anna Prokhodtseva | 2020-09-22 |
| 9741525 | Charged-particle microscope with astigmatism compensation and energy-selection | Lubomir Tuma, Alexander Henstra | 2017-08-22 |
| 9362086 | In-column detector for particle-optical column | Lubomir Tuma, Petr Hlavenka, Petr Syta{hacek over (r)}, Radek {hacek over (C)}e{hacek over (s)}ka | 2016-06-07 |
| 9053899 | Method for imaging a sample in a charged particle apparatus | Lubomír T{dot over (u)}ma, Petr Hlavenka, Petr Syta{hacek over (r)} | 2015-06-09 |