Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12117406 | Charged particle detection for spectroscopic techniques | Bryan Barnard | 2024-10-15 |
| 12099024 | Methods and apparatus for electron backscatter diffraction sample characterisation | Austin Penrose Day, Christopher James Stephens, Martin Petrek | 2024-09-24 |
| 11976388 | Recording of trash in a fiber preparation system | Tobias Wolfer, Petr Cevona | 2024-05-07 |
| 11676795 | Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets | Bohuslav Sed'a, Petr Hlavenka, Libor Novak, Jan Stopka | 2023-06-13 |
| 11195693 | Method and system for dynamic band contrast imaging | Tomá{hacek over (s)} Vystav{hacek over (e)}l | 2021-12-07 |
| 11114275 | Methods and systems for acquiring electron backscatter diffraction patterns | Christopher James Stephens | 2021-09-07 |
| 10978272 | Measurement and endpointing of sample thickness | Tomas Vystavel, Marek Uncovsky | 2021-04-13 |
| 10937627 | Multi-beam electron microscope | Petr Hlavenka, Bohuslav Sed'a | 2021-03-02 |
| 9958403 | Arrangement for X-Ray tomography | Marek Un{hacek over (c)}ovský, Tomá{hacek over (s)} Vystav{hacek over (e)}l, Alan Frank de Jong, Bart Buijsse, Pierre Bleuet | 2018-05-01 |
| 9618463 | Method of acquiring EBSP patterns | Marek Un{hacek over (c)}ovský, Tomá{hacek over (s)} Vystav{hacek over (e)}l | 2017-04-11 |