Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11676795 | Charged particle beam device for inspection of a specimen with a plurality of charged particle beamlets | Pavel Stejskal, Bohuslav Sed'a, Libor Novak, Jan Stopka | 2023-06-13 |
| 11373839 | Method and system for component analysis of spectral data | Jan Klusácek, Ondrej Sembera | 2022-06-28 |
| 11002692 | Method of examining a sample using a charged particle microscope | Tomas Tuma, Jan Hradil | 2021-05-11 |
| 10937627 | Multi-beam electron microscope | Pavel Stejskal, Bohuslav Sed'a | 2021-03-02 |
| 9490100 | Method of using a compound particle-optical lens | Petr Syta{hacek over (r)}, Lubomir Tuma | 2016-11-08 |
| 9362086 | In-column detector for particle-optical column | Lubomir Tuma, Petr Syta{hacek over (r)}, Radek {hacek over (C)}e{hacek over (s)}ka, Bohuslav Sed'a | 2016-06-07 |
| 9153416 | Detection method for use in charged-particle microscopy | Marek Uncovsky | 2015-10-06 |
| 9053899 | Method for imaging a sample in a charged particle apparatus | Bohuslav Sed'a, Lubomír T{dot over (u)}ma, Petr Syta{hacek over (r)} | 2015-06-09 |
| 8735849 | Detector for use in charged-particle microscopy | Marek Uncovsky | 2014-05-27 |