JH

Jan Hradil

FE Fei: 1 patents #375 of 681Top 60%
Overall (All Time): #2,726,375 of 4,157,543Top 70%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11002692 Method of examining a sample using a charged particle microscope Tomas Tuma, Petr Hlavenka 2021-05-11