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FE Fei: 2 patents #250 of 681Top 40%
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Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9053899 Method for imaging a sample in a charged particle apparatus Bohuslav Sed'a, Petr Hlavenka, Petr Syta{hacek over (r)} 2015-06-09
8829470 Configurable charged-particle apparatus Josef {hacek over (S)}esták 2014-09-09