BB

Bart Buijsse

FE Fei: 34 patents #4 of 681Top 1%
Philips: 1 patents #3,761 of 7,731Top 50%
Overall (All Time): #92,321 of 4,157,543Top 3%
36
Patents All Time

Issued Patents All Time

Showing 25 most recent of 36 patents

Patent #TitleCo-InventorsDate
12306119 Methods and systems for determining the absolute structure of crystal Stefano Vespucci 2025-05-20
12009176 Method and system for generating a diffraction image Bart Jozef Janssen 2024-06-11
11988618 Method and system to determine crystal structure Hans Raaijmakers, Peter Christiaan Tiemeijer 2024-05-21
11815476 Methods and systems for acquiring three-dimensional electron diffraction data Jaydeep Sanjay Belapure, Alexander Henstra, Michael Patrick Janus, Stefano Vespucci 2023-11-14
11694874 Method and system for generating a diffraction image Bart Jozef Janssen 2023-07-04
11456149 Methods and systems for acquiring 3D diffraction data Alexander Henstra, Yuchen Deng 2022-09-27
11183364 Dual beam microscope system for imaging during sample processing Yuchen Deng, Petrus Hubertus Franciscus Trompenaars, Alexander Henstra 2021-11-23
11101101 Laser-based phase plate image contrast manipulation Bas Hendriksen, Pleun Dona 2021-08-24
11004655 Diffraction pattern detection in a transmission charged particle microscope Maarten Kuijper 2021-05-11
10935506 Method and system for determining molecular structure Abhay Kotecha 2021-03-02
10651008 Diffraction pattern detection in a transmission charged particle microscope Maarten Kuijper 2020-05-12
10545100 X-ray imaging technique Faysal Boughorbel 2020-01-28
9958403 Arrangement for X-Ray tomography Pavel Stejskal, Marek Un{hacek over (c)}ovský, Tomá{hacek over (s)} Vystav{hacek over (e)}l, Alan Frank de Jong, Pierre Bleuet 2018-05-01
9908778 Method of producing a freestanding thin film of nano-crystalline graphite Radostin Stoyanov Danev, Kasim Sader 2018-03-06
9865427 User interface for an electron microscope Martinus P. M. Bierhoff, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more 2018-01-09
9583303 Aligning a featureless thin film in a TEM Gijs van Duinen 2017-02-28
9312098 Method of examining a sample in a charged-particle microscope Ivan Lazic, Eric Gerardus Theodoor Bosch, Faysal Boughorbel, Kasim Sader, Sorin Lazar 2016-04-12
9293297 Correlative optical and charged particle microscope 2016-03-22
9129774 Method of using a phase plate in a transmission electron microscope Radostin Stoyanov Danev 2015-09-08
9025018 User interface for an electron microscope Martinus P. M. Bierhoff, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more 2015-05-05
9006652 Phase shift method for a TEM 2015-04-14
8835846 Imaging a sample in a TEM equipped with a phase plate Marco Hugo Petrus Moers, Radostin Stoyanov Danev 2014-09-16
8772716 Phase plate for a TEM 2014-07-08
8658974 Environmental cell for a particle-optical apparatus 2014-02-25
8637821 Blocking member for use in the diffraction plane of a TEM Peter Christiaan Tiemeijer 2014-01-28