Bart Buijsse — 36 Patents at Fei

Bart Buijsse has been granted 36 US patents while listed as an inventor at Fei. The first was granted in 2006 and the most recent in May 2025. Bart Buijsse ranks #92,222 of 4,157,543 US inventors in our database (top 2.2%). Patent records list Bart Buijsse in Eindhoven, NL.

Issued Patents All Time

Showing 1–25 of 36 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12306119	Methods and systems for determining the absolute structure of crystal	Stefano Vespucci	2025-05-20
12009176	Method and system for generating a diffraction image	Bart Jozef Janssen	2024-06-11
11988618	Method and system to determine crystal structure	Hans Raaijmakers, Peter Christiaan Tiemeijer	2024-05-21
11815476	Methods and systems for acquiring three-dimensional electron diffraction data	Jaydeep Sanjay Belapure, Alexander Henstra, Michael Patrick Janus, Stefano Vespucci	2023-11-14
11694874	Method and system for generating a diffraction image	Bart Jozef Janssen	2023-07-04
11456149	Methods and systems for acquiring 3D diffraction data	Alexander Henstra, Yuchen Deng	2022-09-27
11183364	Dual beam microscope system for imaging during sample processing	Yuchen Deng, Petrus Hubertus Franciscus Trompenaars, Alexander Henstra	2021-11-23
11101101	Laser-based phase plate image contrast manipulation	Bas Hendriksen, Pleun Dona	2021-08-24
11004655	Diffraction pattern detection in a transmission charged particle microscope	Maarten Kuijper	2021-05-11
10935506	Method and system for determining molecular structure	Abhay Kotecha	2021-03-02
10651008	Diffraction pattern detection in a transmission charged particle microscope	Maarten Kuijper	2020-05-12
10545100	X-ray imaging technique	Faysal Boughorbel	2020-01-28
9958403	Arrangement for X-Ray tomography	Pavel Stejskal, Marek Un{hacek over (c)}ovský, Tomá{hacek over (s)} Vystav{hacek over (e)}l, Alan Frank de Jong, Pierre Bleuet	2018-05-01
9908778	Method of producing a freestanding thin film of nano-crystalline graphite	Radostin Stoyanov Danev, Kasim Sader	2018-03-06
9865427	User interface for an electron microscope	Martinus P. M. Bierhoff, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more	2018-01-09
9583303	Aligning a featureless thin film in a TEM	Gijs van Duinen	2017-02-28
9312098	Method of examining a sample in a charged-particle microscope	Ivan Lazic, Eric Gerardus Theodoor Bosch, Faysal Boughorbel, Kasim Sader, Sorin Lazar	2016-04-12	$20,246,000
9293297	Correlative optical and charged particle microscope	—	2016-03-22	$20,756,000
9129774	Method of using a phase plate in a transmission electron microscope	Radostin Stoyanov Danev	2015-09-08	$8,274,000
9025018	User interface for an electron microscope	Martinus P. M. Bierhoff, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more	2015-05-05	$17,739,000
9006652	Phase shift method for a TEM	—	2015-04-14	$9,203,000
8835846	Imaging a sample in a TEM equipped with a phase plate	Marco Hugo Petrus Moers, Radostin Stoyanov Danev	2014-09-16	$4,686,000
8772716	Phase plate for a TEM	—	2014-07-08	$18,576,000
8658974	Environmental cell for a particle-optical apparatus	—	2014-02-25	$17,543,000
8637821	Blocking member for use in the diffraction plane of a TEM	Peter Christiaan Tiemeijer	2014-01-28	$15,781,000

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Bart Buijsse — 36 Patents

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