Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12306119 | Methods and systems for determining the absolute structure of crystal | Bart Buijsse | 2025-05-20 |
| 11815476 | Methods and systems for acquiring three-dimensional electron diffraction data | Bart Buijsse, Jaydeep Sanjay Belapure, Alexander Henstra, Michael Patrick Janus | 2023-11-14 |
| 11211223 | System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy | Ivan Lazic, Eric Gerardus Theodoor Bosch, Bert Henning Freitag | 2021-12-28 |
| 10234282 | Method and system for determining the position of a radiation source | Aimo Winkelmann | 2019-03-19 |