Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815476 | Methods and systems for acquiring three-dimensional electron diffraction data | Bart Buijsse, Alexander Henstra, Michael Patrick Janus, Stefano Vespucci | 2023-11-14 |
| 11417497 | Method of examining a sample using a charged particle microscope, wherein an electron energy-loss spectroscopy (EELS) spectrum is acquired | Remco Schoenmakers | 2022-08-16 |
| 10923308 | Method and system for energy resolved chroma imaging | Yuchen Deng, Peter Christiaan Tiemeijer, Holger Kohr | 2021-02-16 |