Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12392735 | Sparse image reconstruction from neighboring tomography tilt images | Maurice Peemen, Pavel Potocek | 2025-08-19 |
| 12347083 | Area selection in charged particle microscope imaging | Yuchen Deng, Maurice Peemen | 2025-07-01 |
| 12327342 | Automatic particle beam focusing | Yuchen Deng, Erik Franken, Bart van Knippenberg | 2025-06-10 |
| 12216068 | Bifocal electron microscope | Alexander Henstra, Yuchen Deng | 2025-02-04 |
| 11906450 | Electron diffraction holography | Alexander Henstra, Yuchen Deng | 2024-02-20 |
| 11887809 | Auto-tuning stage settling time with feedback in charged particle microscopy | Yuchen Deng, Erik Franken, Bart van Knippenberg | 2024-01-30 |
| 11460419 | Electron diffraction holography | Alexander Henstra, Yuchen Deng | 2022-10-04 |
| 11404241 | Simultaneous TEM and STEM microscope | Alexander Henstra, Yuchen Deng | 2022-08-02 |
| 10937625 | Method of imaging a sample using an electron microscope | Erik Franken, Remco Schoenmakers, Bart Jozef Janssen, Martin Verheijen, Yuchen Deng +1 more | 2021-03-02 |
| 10923308 | Method and system for energy resolved chroma imaging | Yuchen Deng, Peter Christiaan Tiemeijer, Jaydeep Sanjay Belapure | 2021-02-16 |