Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10937625 | Method of imaging a sample using an electron microscope | Erik Franken, Remco Schoenmakers, Bart Jozef Janssen, Holger Kohr, Yuchen Deng +1 more | 2021-03-02 |
| 9396907 | Method of calibrating a scanning transmission charged-particle microscope | Maximus Theodorus Otten, Abigaël Adriana Maria Kok | 2016-07-19 |
| 8757873 | Method of measuring the temperature of a sample carrier in a charged particle-optical apparatus | Stephanus Hubertus Leonardus van den Boom, Pleun Dona, Laurens Franz Taemsz Kwakman, Uwe Luecken, Hervé-William Rémigy +2 more | 2014-06-24 |