Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9581526 | Method for S/TEM sample analysis | Jason Arjavac, Pei Zou, David Tasker, Gerhard Daniel | 2017-02-28 |
| 9396907 | Method of calibrating a scanning transmission charged-particle microscope | Abigaël Adriana Maria Kok, Martin Verheijen | 2016-07-19 |
| 9275831 | Method for S/TEM sample analysis | Jason Arjavac, Pei Zou, David Tasker, Gerhard Daniel | 2016-03-01 |
| 8890064 | Method for S/TEM sample analysis | Jason Arjavac, Pei Zou, David Tasker, Gerhard Daniel | 2014-11-18 |
| 8492715 | Method of protecting a radiation detector in a charged particle instrument | Gerrit Cornelis van Hoften, Joeri Lof | 2013-07-23 |
| 8455821 | Method for S/TEM sample analysis | Jason Arjavac, Pei Zou, David Tasker, Gerhard Daniel | 2013-06-04 |