AK

Abigaël Adriana Maria Kok

FE Fei: 1 patents #375 of 681Top 60%
Overall (All Time): #3,009,989 of 4,157,543Top 75%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9396907 Method of calibrating a scanning transmission charged-particle microscope Maximus Theodorus Otten, Martin Verheijen 2016-07-19