BJ

Bart Jozef Janssen

FE Fei: 23 patents #10 of 681Top 2%
Overall (All Time): #180,713 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12165835 Stroboscopic illumination synchronized electron detection and imaging Gerard Nicolaas Anne van Veen 2024-12-10
12074007 Rotating sample holder for random angle sampling in tomography Edwin Verschueren, Erik Franken 2024-08-27
12009176 Method and system for generating a diffraction image Bart Buijsse 2024-06-11
11990315 Measurement and correction of optical aberrations in charged particle beam microscopy Erik Franken 2024-05-21
11756762 Rotating sample holder for random angle sampling in tomography Edwin Verschueren, Erik Franken 2023-09-12
11742175 Defective pixel management in charged particle microscopy Erik Franken 2023-08-29
11694874 Method and system for generating a diffraction image Bart Buijsse 2023-07-04
11551906 Time-gated detection, dual-layer SPAD-based electron detection Gerard Nicolaas Anne van Veen, Erik René Kieft 2023-01-10
11417498 Method of manufacturing a charged particle detector Pleun Dona 2022-08-16
11297276 Method and system for high speed signal processing Henricus Gerardus Roeven, Rob Braan, Jeroen Keizer 2022-04-05
11257656 Rotating sample holder for random angle sampling in tomography Edwin Verschueren, Erik Franken 2022-02-22
10937625 Method of imaging a sample using an electron microscope Erik Franken, Remco Schoenmakers, Martin Verheijen, Holger Kohr, Yuchen Deng +1 more 2021-03-02
10825647 Innovative imaging technique in transmission charged particle microscopy Lingbo Yu, Erik Franken 2020-11-03
10692691 Pulse processing Nikolaos Kontaras, Cornelis Sander Kooijman, Duarte Guerreiro Tome Antunes 2020-06-23
10665419 Intelligent pre-scan in scanning transmission charged particle microscopy Erik Franken, Ivan Lazic 2020-05-26
10403470 Pulse processing Nikolaos Kontaras, Cornelis Sander Kooijman, Duarte Guerreiro Tome Antunes 2019-09-03
10389955 Method for detecting particulate radiation Erik Franken, Maarten Kuijper, Lingbo Yu 2019-08-20
10122946 Method for detecting particulate radiation Erik Franken, Maarten Kuijper, Lingbo Yu 2018-11-06
10014158 Innovative image processing in charged particle microscopy Auke van der Heide, Henricus Gerardus Roeven, Jacobus Adrianus Maria Thomassen 2018-07-03
10008363 Method of imaging a specimen using ptychography Eric Gerardus Theodoor Bosch 2018-06-26
9202670 Method of investigating the wavefront of a charged-particle beam Gijs van Duinen, Uwe Luecken, Ross Savage, Stephanus H.L. van den Boom, Ivan Lazic 2015-12-01
8817148 Method for acquiring data with an image sensor Gerrit Cornelis van Hoften, Uwe Luecken 2014-08-26
8766214 Method of preparing and imaging a lamella in a particle-optical apparatus Brian Roberts Routh, Jr., Peter Christiaan Tiemeijer, Thomas G. Miller, David Foord, Ivan Lazic 2014-07-01