GD

Gijs van Duinen

FE Fei: 4 patents #139 of 681Top 25%
Overall (All Time): #1,167,247 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10651007 Cryogenic cell for mounting a specimen in a charged particle microscope Gerbert Jeroen van de Water, Roland W. P Jonkers, Stephanus H.L. van den Boom, Fotios Sakellariou 2020-05-12
9583303 Aligning a featureless thin film in a TEM Bart Buijsse 2017-02-28
9202670 Method of investigating the wavefront of a charged-particle beam Bart Jozef Janssen, Uwe Luecken, Ross Savage, Stephanus H.L. van den Boom, Ivan Lazic 2015-12-01
9136087 Method of investigating and correcting aberrations in a charged-particle lens system Ivan Lazic, Peter Christiaan Tiemeijer 2015-09-15