UL

Uwe Luecken

FE Fei: 11 patents #49 of 681Top 8%
Overall (All Time): #420,854 of 4,157,543Top 15%
12
Patents All Time

Issued Patents All Time

Showing 1–12 of 12 patents

Patent #TitleCo-InventorsDate
9202670 Method of investigating the wavefront of a charged-particle beam Bart Jozef Janssen, Gijs van Duinen, Ross Savage, Stephanus H.L. van den Boom, Ivan Lazic 2015-12-01
9147551 Method for electron tomography Remco Schoenmakers, Johannes Antonius Maria van den Oetelaar 2015-09-29
8912491 Method of performing tomographic imaging of a sample in a charged-particle microscope Remco Schoenmakers, Erik Franken 2014-12-16
8817148 Method for acquiring data with an image sensor Bart Jozef Janssen, Gerrit Cornelis van Hoften 2014-08-26
8757873 Method of measuring the temperature of a sample carrier in a charged particle-optical apparatus Stephanus Hubertus Leonardus van den Boom, Pleun Dona, Laurens Franz Taemsz Kwakman, Hervé-William Rémigy, Hendrik Nicolaas Slingerland +2 more 2014-06-24
8692196 Method of use for a multipole detector for a transmission electron microscope Peter Christiaan Tiemeijer, Alan Frank de Jong, Hendrik Nicolaas Slingerland 2014-04-08
8592762 Method of using a direct electron detector for a TEM Alan Frank de Jong, Gerrit Cornelis van Hoften, Frank Jeroen Pieter Schuurmans 2013-11-26
8569693 Distortion free stigmation of a TEM Maarten Bischoff, Alexander Henstra, Peter Christiaan Tiemeijer 2013-10-29
8338782 Detector system for transmission electron microscope Remco Schoenmakers, Frank Jeroen Pieter Schuurmans 2012-12-25
8334512 Detector system for use with transmission electron microscope spectroscopy Frank Jeroen Pieter Schuurmans, Cornelis Sander Kooijman 2012-12-18
7845245 Method for attaching a sample to a manipulator by melting and then freezing part of said sample Michael Frederick Hayles 2010-12-07
7825378 Method for obtaining a scanning transmission image of a sample in a particle-optical apparatus Alevtyna Yakushevska, Erwan Sourty, Bert Henning Freitag 2010-11-02