MH

Michael Frederick Hayles

FE Fei: 4 patents #139 of 681Top 25%
PO Philips Electron Optics: 1 patents #3 of 7Top 45%
Overall (All Time): #1,007,803 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
8754384 Sample preparation stage Johannes Antonius Hendricus Wilhelmus Gerardus Persoon, Andreas Theodorus Engelen, Mathijs Petrus Wilhelmus van den Boogaard, Rudolf Johannes Peter Gerardus Schampers 2014-06-17
8674323 Forming an electron microscope sample from high-pressure frozen material Rudolf Johannes Peter Gerardus Schampers, Dirk Arie Mattheus de Winter, Christianus Thomas Wilhelmus Maria Schneijdenberg 2014-03-18
7845245 Method for attaching a sample to a manipulator by melting and then freezing part of said sample Uwe Luecken 2010-12-07
6888136 Method of obtaining a particle-optical image of a sample in a particle-optical device Remco Theodorus Johannes Petrus Geurts 2005-05-03
6376839 SEM for transmission operation with a location-sensitive detector Gerardus N. A. Van Veen 2002-04-23