JP

Johannes Antonius Hendricus Wilhelmus Gerardus Persoon

FE Fei: 10 patents #53 of 681Top 8%
📍 Waalre, NL: #55 of 260 inventorsTop 25%
Overall (All Time): #503,072 of 4,157,543Top 15%
10
Patents All Time

Issued Patents All Time

Showing 1–10 of 10 patents

Patent #TitleCo-InventorsDate
11127560 Charged particle microscope with a manipulator device, and method of preparing a specimen with said charged particle microscope Andreas Theodorus Engelen, Ruud Schampers 2021-09-21
9865427 User interface for an electron microscope Martinus P. M. Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel +5 more 2018-01-09
9512460 Method of studying a cryogenic sample in an optical microscope Tobias Mayer, Rainer Daum, Matthias Geisbauer, Rudolf Johannes Peter Gerardus Schampers 2016-12-06
9142384 Method of welding a frozen aqueous sample to a microprobe Rudolf Johannes Peter Gerardus Schampers, Andreas Theodorus Engelen 2015-09-22
9025018 User interface for an electron microscope Martinus P. M. Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel +5 more 2015-05-05
8921785 Cooperating capillary and cap for use in a high-pressure freezer Rudolf Johannes Peter Gerardus Schampers, Andreas Theodorus Engelen 2014-12-30
8754384 Sample preparation stage Andreas Theodorus Engelen, Mathijs Petrus Wilhelmus van den Boogaard, Rudolf Johannes Peter Gerardus Schampers, Michael Frederick Hayles 2014-06-17
8598524 Slider bearing for use with an apparatus comprising a vacuum chamber Andreas Theodorus Engelen, Siegfried Lichtenegger, Petrus Henricus Joannes Van Dooren 2013-12-03
8309921 Compact scanning electron microscope Martinus P. M. Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel +5 more 2012-11-13
7906762 Compact scanning electron microscope MART PETRUS MARIA BIERHOFF, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel +5 more 2011-03-15