HT

Hendrik Gezinus Tappel

FE Fei: 10 patents #53 of 681Top 8%
U.S. Philips: 1 patents #4,133 of 8,851Top 50%
📍 Casteren, NL: #1 of 5 inventorsTop 20%
Overall (All Time): #458,094 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
9865427 User interface for an electron microscope Martinus P. M. Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Colin August Sanford +5 more 2018-01-09
9025018 User interface for an electron microscope Martinus P. M. Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Colin August Sanford +5 more 2015-05-05
8354587 Hermetically sealed housing with electrical feed-in Cornelis Sander Kooijman 2013-01-15
8309921 Compact scanning electron microscope Martinus P. M. Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Colin August Sanford +5 more 2012-11-13
7906762 Compact scanning electron microscope MART PETRUS MARIA BIERHOFF, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Colin August Sanford +5 more 2011-03-15
7474419 Stage assembly, particle-optical apparatus comprising such a stage assembly, and method of treating a sample in such an apparatus Ian Johannes Bernardus van Hees, Danny Lankers, Gerard Nicolaas Anne van Veen, Richard Young, Lucille A. Giannuzzi 2009-01-06
7408178 Method for the removal of a microscopic sample from a substrate 2008-08-05
7301157 Cluster tool for microscopic processing of samples Bart Buijsse, Mark Meuwese, Bernardus Jacobus Marie Bormans, Hendrik Nicolaas Slingerland 2007-11-27
7005636 Method and apparatus for manipulating a microscopic sample 2006-02-28
6963068 Method for the manufacture and transmissive irradiation of a sample, and particle-optical system Peter E. S. J. Asselbergs, Gerard Nicolaas Anne van Veen 2005-11-08
5093578 Valve device for a particle beam apparatus Hendrik Nicolaas Slingerland 1992-03-03