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MART PETRUS MARIA BIERHOFF

FE Fei: 1 patents #375 of 681Top 60%
📍 Deurne, NL: #38 of 80 inventorsTop 50%
Overall (All Time): #3,243,835 of 4,157,543Top 80%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7906762 Compact scanning electron microscope Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel, Colin August Sanford +5 more 2011-03-15