CS

Colin August Sanford

FE Fei: 10 patents #53 of 681Top 8%
MI Mks Instruments: 4 patents #87 of 442Top 20%
CG Carl Zeiss Nts Gmbh: 2 patents #17 of 103Top 20%
AM Amray: 1 patents #3 of 5Top 60%
CG Carl Zeiss Microscopy Gmbh: 1 patents #298 of 564Top 55%
UG University Of North Carolina At Greensboro: 1 patents #20 of 51Top 40%
📍 Atkinson, NH: #6 of 106 inventorsTop 6%
🗺 New Hampshire: #709 of 12,181 inventorsTop 6%
Overall (All Time): #252,256 of 4,157,543Top 7%
18
Patents All Time

Issued Patents All Time

Showing 1–18 of 18 patents

Patent #TitleCo-InventorsDate
11222770 Microwave applicator with solid-state generator power source Mohammad Kamarehi, Ken Trenholm, Kevin W. Wenzel, Olivia Keller 2022-01-11
10910798 Apparatus and method for ignition of a plasma system and for monitoring health of the plasma system Atul Gupta, Joshua Lamontagne, Kevin W. Wenzel 2021-02-02
10790118 Microwave applicator with solid-state generator power source Mohammad Kamarehi, Ken Trenholm, Kevin W. Wenzel, Olivia Keller 2020-09-29
10505348 Apparatus and method for ignition of a plasma system and for monitoring health of the plasma system Atul Gupta, Joshua Lamontagne, Kevin W. Wenzel 2019-12-10
9865427 User interface for an electron microscope Martinus P. M. Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel +5 more 2018-01-09
9025018 User interface for an electron microscope Martinus P. M. Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel +5 more 2015-05-05
8894796 Nanopore fabrication and applications thereof Adam R. Hall, Jijin Yang, David C. Ferranti 2014-11-25
8633451 Ion sources, systems and methods Billy W. Ward, John A. Notte, IV, Alexander Groholski, Mark D. DiManna 2014-01-21
8399864 Dual beam system Raymond Hill, Lawrence Scipioni, Mark D. DiManna, Michael Tanguay 2013-03-19
8309921 Compact scanning electron microscope Martinus P. M. Bierhoff, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel +5 more 2012-11-13
8124941 Increasing current in charged particle sources and systems John A. Notte, IV, Randall G. Percival, Alexander Grohloski 2012-02-28
8013311 Dual beam system Raymond Hill, Lawrence Scipioni, Mark D. DiManna, Michael Tanguay 2011-09-06
7917349 Combined hardware and software instrument simulator for use as a teaching aid Steven Berger 2011-03-29
7906762 Compact scanning electron microscope MART PETRUS MARIA BIERHOFF, Bart Buijsse, Cornelis Sander Kooijman, Hugo Van Leeuwen, Hendrik Gezinus Tappel +5 more 2011-03-15
7601976 Dual beam system Raymond Hill, Lawrence Scipioni, Mark D. DiManna, Michael Tanguay 2009-10-13
7161159 Dual beam system Raymond Hill, Lawrence Scipioni, Mark D. DiManna, Michael Tanguay 2007-01-09
6852982 Magnetic lens Martinus P. M. Bierhoff, Cornelis Sander Kooijman 2005-02-08
5734164 Charged particle apparatus having a canted column 1998-03-31