Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12270774 | System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particles | John A. Notte, IV, Jeffrey Sauer, Terry Griffin | 2025-04-08 |
| 12044638 | System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particles | John A. Notte, IV, Jeff Sauer, Terry Griffin | 2024-07-23 |
| 9530612 | Charged particle beam system and method of operating a charged particle beam system | John A. Notte, IV, Raymond Hill, Robert Conners, Alexander Groholski | 2016-12-27 |
| 9530611 | Charged particle beam system and method of operating a charged particle beam system | John A. Notte, IV, Alexander Groholski, Robert Conners, Raymond Hill | 2016-12-27 |
| 8993981 | Charged particle source with light monitoring for tip temperature determination | John A. Notte, IV, Randall G. Percival, Milton Rahman, Louise S. Barriss, Russell Mello | 2015-03-31 |
| 8633451 | Ion sources, systems and methods | Billy W. Ward, Colin August Sanford, John A. Notte, IV, Alexander Groholski | 2014-01-21 |
| 8399864 | Dual beam system | Raymond Hill, Lawrence Scipioni, Colin August Sanford, Michael Tanguay | 2013-03-19 |
| 8013311 | Dual beam system | Raymond Hill, Lawrence Scipioni, Colin August Sanford, Michael Tanguay | 2011-09-06 |
| 7601976 | Dual beam system | Raymond Hill, Colin August Sanford, Lawrence Scipioni, Michael Tanguay | 2009-10-13 |
| 7161159 | Dual beam system | Raymond Hill, Colin August Sanford, Lawrence Scipioni, Michael Tanguay | 2007-01-09 |