JS

Jeffrey Sauer

CG Carl Zeiss Smt Gmbh: 1 patents #657 of 1,189Top 60%
📍 Danvers, MA: #173 of 334 inventorsTop 55%
🗺 Massachusetts: #42,150 of 88,656 inventorsTop 50%
Overall (All Time): #1,706,015 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12270774 System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particles John A. Notte, IV, Mark D. DiManna, Terry Griffin 2025-04-08
8590774 Reusable shipping containers and mailing envelopes 2013-11-26